Transmission electron microscopy and diffractometry of materials graduate texts in physics fultz brent howe james isbn 9783642297601 kostenloser versand fur alle bucher mit versand und verkauf duch amazon. Part of the graduate texts in physics book series gtp log in to check access buy ebook this book explains concepts of transmission electron microscopy tem and x ray diffractometry xrd that are important for the characterization of materials the fourth edition adds important new techniques of tem such as electron tomography nanobeam diffraction and geometric phase analysis a new . This book explains concepts of transmission electron microscopy tem and x ray diffractometry xrd that are important for the characterization of materials the third edition has been updated to cover important technical developments including the remarkable recent improvement in resolution of the tem this edition is not substantially longer than the second but all chapters have been updated and revised for clarity a new chapter on high resolution stem methods has been added the book . This textbook develops the concepts of transmission electron microscopy tem and x ray diffractometry xrd that are important for the characterization of materials it emphasizes themes common to both techniques such as scattering from atoms wave interference and the formation and analysis of diffraction patterns it explains the uniqueness of each technique especially imaging and . Stanford libraries official online search tool for books media journals databases government documents and more